Nanonics Imaging - Atomic Force Microscopy (AFM) Systems

Flash Photonics and Nanonics Imaging, Ltd. have partnered to offer a suite of spectroscopic and advanced imaging products at the cutting edge of Atomic Force Microscopy (AFM). AFM provides a variety of atomic-level (10nm) characterizations such as topography, conductivity, elasticity, adhesion, frictional forces, thermal measurements, and hardness. Nanonics can integrate spectroscopic solutions to add chemical characterization to these systems including Raman spectroscopy, allowing identification of materials' phase, chemical structure, and crystal structure. AFM, when combined with Raman, enables a synergistic and holistic analysis of a given material, correlating the topography and physical properties of materials with their chemical structure. Flash Photonics offers a diverse portfolio of Nanonics multidimensional and nanoscale instruments including the Hydra BioAFM, MultiView 4000, and the SpectraView 2500. These systems uniquely offer integration with one or a combination of: Bio-Imaging Applications, Terahertz Spectroscopy, Cryogenic Systems, High Magnetic Field Studies, and Tip Enhanced Raman Scattering (TERS). Contact us if you have questions and would like to learn how AFM can work for you.

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